Sharma, Sunil Kumar, M.N.N.I.T Allahabad, India
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Vol 1, No 2 - 3 (2011) - Review Articles
An Explicit Approach to Compare Crosstalk Noise and Delay in VLSI RLC Interconnect Modeled with Skin Effect with Step and Ramp Input
Abstract
ISSN: 2249 – 474X