Journal of VLSI Design Tools & Technology

Open Journal Systems
Journal Help
Subscription Login to verify subscription
User
Font Size

Notifications
  • View
  • Subscribe
Language
Journal Content

Browse
  • By Issue
  • By Author
  • By Title
  • Other Journals
Information
  • For Readers
  • For Authors
  • For Librarians
Keywords 45nm Technology ADC Carry Select Adder (CSLA) Comparator Current Controlled Conveyor, Current Mode, Translinear, SPICE. Gate Diffusion Input (GDI) Low Power MOS technology Noise Shaping Over Sampling Ratio Pipelined ADC Shift register, dual-edge triggered, flip-flop, low power, multi-threshold CMOS. Sigma Delta Silicon-on-insulator (SOI) Speed device scaling digital calibration dynamic comparator non-linearity correction semiconductor manufacturing static comparator
Current Issue Atom logo
RSS2 logo
RSS1 logo
  • Home
  • About
  • Login
  • Register
  • Search
  • Current
  • Archives
  • Announcements
  • Author Guidelines
  • Referencing Pattern
  • Sample Research Paper
  • Sample Review Paper
  • Publication Management Team
  • STM Home Page
  • New Submission
Home > Login

Login

  • Not a user? Register with this site
  • Forgot your password?


ISSN: 2249 – 474X