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Implementation of Low Power Shift Registers Using Multi-Threshold CMOS Technique

Archana Kumari, Navdeep Prashar

Abstract


This paper enumerates the design of low power shift registers using dual-edge triggered flip-flop (DETFF). In the conventional shift registers, high leakage current is becoming a significant contributor to power dissipation. In order to overcome this problem, the multi-threshold complementary metal oxide semiconductor (MTCMOS) technology is used for leakage minimization in proposed designs. This technology features both low-threshold and high-threshold voltage MOSFETs. High-threshold voltage MOSFETs reduced the stand-by leakage current during the sleep mode. The conventional and proposed shift registers are presented and compared. The result shows a significant reduction in power as compared to the conventional shift registers. The shift register has been designed and simulated by using tanner v13.0 tools.

 

 

Keywords: Shift register, dual-edge triggered, flip-flop, low power, multi-threshold CMOS

Cite this Article

 

Archana Kumari, Navdeep Prashar. Implementation of Low Power Shift Registers Using Multi-Threshold CMOS Technique. Journal of VLSI Design Tools and Technology. 2016; 6(2):     53–61p.


Keywords


Shift register, dual-edge triggered, flip-flop, low power, multi-threshold CMOS.

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